Three in One: Global Patent Trials
- 4/18/2019 8:00 AM - 6:00 PM
Please arrive early for registration
- Daniel Patrick Moynihan Courthouse
500 Pearl Street
New York, New York 10007
Please save the date to attend this full-day CLE program of mock mini-trials that will provide an in depth and comprehensive analysis of the changing landscape of patent law and practice in Germany, Japan, and USA. The event will feature pre-eminent judges and experienced patent litigators from all three countries. Presentations promise to be extremely insightful, and the program will conclude with a networking reception. An invitation with registration information will follow. Click HERE for further information.