2015 July 29 USPTO Patent Quality Overview

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Event Date

7/29/2015 5:15 PM - 6:30 PM
Please arrive early for registration

Location

Fordham School of Law
150 West 62nd Street
Costantino Room 2-02C
New York, New York 10023

Note: Registration will be closed on Tuesday, July 28 at 12:00 PM. There are NO walk-in registrations at this program.

NYIPLA, in conjunction with the USPTO and Fordham IP Institute, is hosting the Patent Quality Overview on Wednesday, July 29, 5:30PM, at Fordham IP Institute, 150 West 62nd Street, Costantino Room 2-02C, New York.

USPTO Patent Quality Overview

Valencia Martin Wallace, Deputy Commissioner for Patent Quality, United States Patent and Trademark Office (USPTO), along with other USPTO Executives will provide an overview of the agency’s Enhanced Patent Quality Initiative. Mark Bloomberg, Esq., Zuber Lawler & Del Duca, and Robert Rando, Esq., The Rando Law Firm P.C., will also participate as panelists to provide a litigation perspective on Enhanced Patent Quality Initiative issues. The presentation will include:

clarifying the prosecution record
sharing insights of internal and external best practices that will result in a clear record
a demonstration of the agency’s interview collaboration tools

Participants will have the opportunity to ask questions and provide feedback.